CENTRAL RESEARCH FACILITY (CRF) - SCANNING ELECTRON MICROSCOPE (SEM) : TRANSMISSION ELECTRON MICROSCOPE (TEM) : INSTRON MACHINE : NANO INDENTATION : JEOL JSM-7610F FEEG-SEM : INSTRON 5900R UNIVERSAL TESTING MACHINE : X-RAY DIFFRACTOMETER : MULTIPURPOSE TRIBOMENTER : 3D OPTICAL SURFACE PROFILERS : STM - AFM - MFM : HALL EFFECT MEASUREMENT SET-UP : MELTING FURNACE : THERMAL EVAPORATION SYSTEM

Standardised Solutions

ASAM International Conference

Central Research Facility(CRF)

Scanning Electron Microscope, Transmission Electron Microscope, Instron Machine, Nano-indentation
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Center of Excellence (COE)

Multipurpose Tribometer, 3D Optical Surface Profilers, STM - AFM - MFM, Hall Effect Measurement, Melting Furnace Thermal Evaporation System
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Others

JEOL JSM-7610F FEG-SEM, Instron 5900R universal testing machine, X-RAY DIFFRACTOMETER
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