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Central Research Facility(CRF)

Scanning Electron Microscope, Nano-indentation
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Center of Excellence (COE)

Multipurpose Tribometer, 3D Optical Surface Profilers, STM - AFM - MFM, Hall Effect Measurement, Melting Furnace Thermal Evaporation System
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Others

JEOL JSM-7610F FEG-SEM, Instron 5900R universal testing machine, X-RAY DIFFRACTOMETER
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