JEOL JSM-7610F FEG-SEM
(Metallurgy and Materials Engineering)

 

 

Overview

With semi-in-lens detectors and an in-the-lens Schottky field emission gun – to deliver high resolution with wide range of probe currents for all applications The JSM-7600F offers true high magnification with 1nm resolution and stability, making it possible to observe the fine surface morphology of nanostructures.

The JSM-7610F integrates a full set of detectors for secondary electrons, EDS, EBSD, It is a has applications in nanotechnology, material science, biology, compositional and structural analysis.

Key Features :

  • High resolution.
  • High probe current for various analytical purposes (EDS, EBSD).
  • Gentle Beam mode for top-surface imaging, reduced beam damage and charge suppression
  • Eco design for energy conservation.
  • crosshead speed 0.5-500mm/min

Other attached facilities :

 

Energy Dispersive Spectroscopy (EDS).

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X-Max

  • The X-MaxN is a SDD detector resolution and low energy detectability is independent of sensor size because of its external FET design.
  • High resolution performance on all sensor sizes
  • Excellent low energy analysis, including Be detection on all sensor sizes
  • Productive count rates at low beam currents
  • No need to change imaging conditions for X-ray analysis
  • Significantly higher count rates at the same beam current
  • Shorter acquisition times
  • Better statistical confidence
  • Practical analysis with small beam diameters
  • Maximising spatial resolution
  • Getting the best out of your high resolution SEM

EBSD Oxford Nordlys - Electron Back Scatter Diffraction

 

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The AZtec EBSD system combines the speed and sensitivity of the world's fastest and most sensitive EBSD detector, Symmetry, with the superior analytical performance of AZtecHKL software to create a powerful and versatile tool for
Electron Backscatter Diffraction (EBSD) and Transmission Kikuchi Diffraction (TKD) analysis.

It identifies :

  • Crystal orientation
  • Grain size
  • Global and local texture
  • Recrystallise/deformed fractions
  • Strain analysis
  • Grain boundary characterisation
  • Phase identification, distribution and transformations

 

 

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