SCANNING ELECTRON MICROSCOPE (SEM)
Central Research Facility (CRF)
Central Research Facility (CRF)
JEOL USA Scanning Electron Microscopes
JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early
1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the
long lifetime of our instruments.
JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new
generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine
nanopatterns, and pinpoint elusive quality problems.